The K1947VC015 integrated circuit is designed for use as part of high-speed solid state drives with USB 3.0 interface, featuring increased reliability and extended operating temperature range up to 1 Tbyte. The chip acts as a controller that provides read, write, data integrity monitoring and bit error correction for NAND-Flash memory.
High reliability and fault tolerance of the drives based on the K1947VC015 controller is ensured by the increased corrective capacity of the BCS code, end-to-end data integrity control, built-in current state control, application of the data backup and recovery (RAIN) technology, as well as the possibility of using NAND flash memory with a high number of rewrite cycles.
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