The RXI systems are designed for reproduction and measurement of DC electric voltage, DC electric force, time and derived from them quantities during testing of ICs of a wide nomenclature for compliance with the purpose indicators by methods of functional control and parametric measurements.
The principle of operation is based on methods of functional control and parametric measurements of digital and mixed-signal ICs, static and dynamic memory, as well as systems on a crystal, on a wafer and in a housing.
RXI systems are designed for complex automated measurement and control of parameters at all stages of the life cycle of ICs - during development, testing, production and incoming inspection, as well as during operation of electronic products for special and general industrial purposes.
RXI systems belong to the design-component devices of variable composition with architecture of modular type, providing for customised configuration of SIs.
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