Integrated Circuit Testing Complex for Digital ICs FORMULA BiS-2K — FORM LLC

Name: Integrated Circuit Testing Complex for Digital ICs FORMULA BiS-2K
Brand: FORMULA
SKU: 602461
Availability: InStock

Brend: FORMULA

so'm 378,000,000 - so'm 1,209,600,000 UZS

MOQ: 1 sets

Asosiy xususiyatlar

Reproducible temperature range: from 50 to 140 °C

Deviation of the temperature in the useful volume of the chamber from the set point in steady state mode: ±2 °C

Number of slots for installing test solutions: 7 pcs

Working medium in the ETT chamber: dry nitrogen

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Tavsif

The FORMULA BiS-2K complex is designed for testing of small and medium-sized integrated circuits, including digital ICs, including hardware logic and static RAM under conditions of regulated gas environment by ETT methods; failure tests; exposure to increased temperature of the working environment; dynamic, static functional control, as well as measurement of static parameters.

Structurally, the FORMULA BiS-2K Complex consists of a test volume rack with a test chamber, a rack of control systems, a rack of load boards and an electronics rack, which houses the FORMULA 2K Tester.

The advantages of the FORMULA BiS-2K Complex are the implementation of the TDBI (test during burning) system - testing of ICs during training - testing simultaneously with ETT due to the integration of the FORMULA 2K Tester into the Complex, as well as the possibility of testing under conditions of controlled gas environment in order to exclude oxidation of the tested products.

Xususiyatlar

Reproducible temperature range

from 50 to 140 °C

Deviation of the temperature in the useful volume of the chamber from the set point in steady state mode

±2 °C

Number of slots for installing test solutions

7 pcs

Working medium in the ETT chamber

dry nitrogen

Maximum leakage of dry nitrogen during ETT operation

no more than 15 l/h

Time to reach the limit value of the reproducible temperature

no more than 60

Number of bidirectional I/O channels per slot

86 pcs

Frequency of data recording/reading in the process of functional control during ETT carrying out

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