High-Performance Electrical Thermal Training and Testing Complex FORMULA BiS | FORM LLC | Rossiyadan ulgurji savdo
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High-Performance Electrical Thermal Training and Testing Complex FORMULA BiS

High-Performance Electrical Thermal Training and Testing Complex FORMULA BiS — FORM LLC

Brend: Formula BiS
so'm 529,200,000 - so'm 1,890,000,000 UZS
MOQ: 1 sets

Asosiy xususiyatlar

Reproducible temperature range: from 55 to 150 °C
Total time to reach the set thermal mode, taking into account temperature stabilization in the useful volume of the heat chamber: Flat grinder, Specialised grinder
Time to reach the limit values of the reproducible temperature, not more than: 60
Time of stabilization of the set temperature mode after reaching the reproducible temperature, not more than: 30

Tavsif

The complexes of electro-thermotraining (ETT) of FORMULA BiS series are designed for testing of integrated circuits (IC) in accordance with the requirements of the operational process flow charts for the corresponding groups of ICs according to OST 11 073.013 2008 using the following methods:- Electro-thermotraining;- Failure tests;- Exposure to elevated temperature of the working environment.The peculiarity of FORMULA BiS ETT complexes is the modular architecture, which allows to configure the control and test equipment in accordance with the Customer's tasks, both in terms of performance requirements and requirements to electrical modes.The FORMULA BiS is a modular test system consisting of an Electronics Module and one or two Modules of a test chamber with thermal stabilisation system (CIT Module). The photo shows the FORMULA BiS in configuration with two CIT Modules.

Xususiyatlar

Reproducible temperature range
from 55 to 150 °C
Total time to reach the set thermal mode, taking into account temperature stabilization in the useful volume of the heat chamber
Flat grinder, Specialised grinder
Time to reach the limit values of the reproducible temperature, not more than
60
Time of stabilization of the set temperature mode after reaching the reproducible temperature, not more than
30
Permissible temperature deviation in the useful volume of the chamber from the set point in steady state mode at temperatures up
± 3 °C
Permissible temperature deviation in the usable volume of the chamber from the setpoint in steady-state mode at temperatures fro
± 5 °C
Maximum temperature gradient in the working volume, max.
10 °C
Instability of steady-state temperature maintenance
±2 °C
Maximum number of load boards (test boards) placed in the test chamber of the KIT Module
32 pcs

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