Electric Thermal Training Complex for Integrated Circuits FORMULA BiS — FORM LLC

Name: Electric Thermal Training Complex for Integrated Circuits FORMULA BiS
Brand: FORMULA
SKU: 170721
Availability: InStock

Brend: FORMULA

so'm 189,000,000 - so'm 756,000,000 UZS

MOQ: 1 sets

Asosiy xususiyatlar

Reproducible temperature range: from 55 to 150 °C

Total time to reach the set thermal mode, taking into account temperature stabilization in the useful volume of the heat chamber: Flat grinder, Specialised grinder

Time to reach the limit values of the reproducible temperature, not more than: 60

Time of stabilization of the set temperature mode after reaching the reproducible temperature, not more than: 30

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Tavsif

The FORMULA BiS series electro-thermotracing (ETT) complexes are designed for testing integrated circuits (ICs) in accordance with the requirements of the operational process flow charts for the corresponding groups of ICs according to OST 11 073.013 2008 using the following methods:

- Electro-termination;

- Failure tests;

- Exposure to elevated temperature of the working environment.

The peculiarity of FORMULA BiS ETT complexes is the modular architecture, which allows to configure the test equipment in accordance with the Customer's tasks, both in terms of performance requirements and requirements to electrical modes.

FORMULA BiS is a modular type test system, which includes an Electronics Module and one or two Modules of a test chamber with thermal stabilisation system (CIT Module).

The photo shows the FORMULA BiS ETT System in configuration with two KIT Modules.

Xususiyatlar

Reproducible temperature range

from 55 to 150 °C

Total time to reach the set thermal mode, taking into account temperature stabilization in the useful volume of the heat chamber

Flat grinder, Specialised grinder

Time to reach the limit values of the reproducible temperature, not more than

Time of stabilization of the set temperature mode after reaching the reproducible temperature, not more than

Permissible temperature deviation in the useful volume of the chamber from the set point in steady state mode at temperatures up

± 3 °C

Permissible temperature deviation in the usable volume of the chamber from the setpoint in steady-state mode at temperatures fro

± 5 °C

Maximum temperature gradient in the working volume, max.

10 °C

Instability of steady-state temperature maintenance

±2 °C

Maximum number of load boards (test boards) placed in the test chamber of the KIT Module

32 pcs

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